boundary scan造句
例句与造句
- Standard test access port and boundary scan architecture
标准测试存取口及边界扫描体系结构 - Application of boundary scan technique to the design for board - level test
边界扫描技术在板级可测性设计中的应用 - The article also addresses the mechanism of vector creation for boundary scan
本文进一步分析了边界扫描测试矢量生成机制。 - Boundary scan aims at the test of application system , e . g . pcb test
边界扫描测试是针对芯片的应用系统进行测试的，如pcb板测试。 - As a kind of new developing bit technology , boundary scan technology is widely used in industry
边界扫描技术作为一种新兴的bit技术,在工业界内得到了广泛的应用。 - It's difficult to find boundary scan in a sentence. 用boundary scan造句挺难的
- A plan of design for test based of boundary scan testing is introduced for this signal processing system
接着，提出了该信号处理系统基于边界扫描的可测性设计方案。 - International standard ieee 1149 . 1 describes the basic circuit structure and performance of boundary scan
国际标准ieee1149 . 1规定了边界扫描的基本电路结构和功能。 - Jx5 microprocessor ’ s testing structure comprises built - in self - test ( bist ) , boundary scan and internal scan
Jx5微处理器的测试结构由bist 、边界扫描和内部扫描三部分组成。 - In this paper , we combine the standard modules realize the boundary scan of estarl and also expand it to the test of internal circuit . this structure can save the i / o port of the chip and simplify the testing program
本文结合标准模块设计实现了estar1的边界扫描结构，并进行了扩展，应用到芯片内部测试，节约了测试i / o口消耗，简化了测试过程。 - In this paper we investigate and carry out boundary scan ^ internal scan and built - in self - test three dft technologies in the embedded microprocessor estarl and get satisfying result , the fault coverage is more than 96 %
本文针对嵌入式微处理器estar1的结构特点，研究并实现了边界扫描、内部全扫描和内建自测试三种可测性设计技术，取得了良好的效果，故障覆盖率达到96以上。 - It is seen from the result of the experiment that pseudo exhaustive test with deltascan involvement is truly a simple and practical method to produce vectors for boundary scan , it is suitable for any kinds of boundary scan devices
从试验结果可知，伪穷举法与deltascan相结合的确是生成边界扫描测试矢量的一个非常简单实用的方法，适用于任何一种边界扫描元件的测试矢量的生成。 - There are a lot of methods available to create test vector . the thesis addresses their characteristics of the methods and special structure of boundary scan circuit respectively and come to a conclusion of pseudo - exchausive testing the most rational method applied to this situation
测试矢量的生成方法很多，本文在研究了各种方法的特性，以及边界扫描电路的特殊结构后，采用了伪穷举法生成测试矢量。 - Not only the scan route solution , the built - in self - test solution and the boundary scan solution of design for testability are summarized , but also the applications and countermeasures of these 3 solutions are analysed and compared in details
摘要综述了超大规模集成电路的几种主要的可测试性设计技术，如扫描路径法、内建自测试法和边界扫描法等，并分析比较了这几种设计技术各自的特点及其应用方法和策略。 - As one of the design for testability technology , boundary scan test ( bst ) fixes boundary scan cells between the device pins and core logics . thus , the bsc acts as the virtual test probe that carries out the test stimulus and captures the test response
作为一种结构插入的可测性技术,边界扫描测试( bst )技术将边界扫描寄存器单元安插在集成电路内部的每个引脚上,其作用相当于设置了施加激励和观测响应的内建虚拟探头。 - Chapter two detailedly presents the design of the boundary scan testing system which is in accordance with ieee . 1149 . correspondingly two special - used data registers are added , one of which is the scanning chain register and the other is the child scanning chain control - register
文中第二章按照ieee . 1149标准详细设计了边缘扫描测试系统，相应增加了两个专用数据寄存器，其中一个为扫描链寄存器，一个为扫描子链控制寄存器。
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